OKins Electronics www.okins.co.kr Spring Probes / Genaro Pin OKins Electronics Spring Probes / Genaro Pin OKins Electronics Pin Types Spring Probes / Genaro Pin & Pin Types Spring Probes Test Sockets Pin Types Best selection for yield performance and cost reduction Double Pin Single Pin Genaro Series Others Engineering challenges for diversified technical requirements Double Pin Single Pin Genaro Series Others Market leading initiative with high-end specifications Top Plunger Tip Shapes Double Pin Single Pin Genaro Series Others and technical advancement Top Plunger Tip Shapes Reduced Crown Needle Top Plunger Tip Shapes Crown Reduced Needle Crown Needle Crown Reduced Reduced Crown Needle Crown Crown Round Kelvin (L) Kelvin(T) Crown Kelvin (T) Round Kelvin (L) Kelvin(T) Kelvin (L) Round Kelvin (L) Kelvin(T) Flat 8 Crown 9 Crown Round Flat 8 Crown 9 Crown 9 Crown 8 Crown Flat 8 Crown 9 Crown Flat 04 04 04 Spring Probes in pitch Characteristics 7.0 0.20mm 0.30mm 0.40mm 0.50mm 0.65mm 0.80mm • Proven contact solution for IC device testing • Customized for high-end testin g requirements 4.5 • High performance for sensitive device testing 3.0 • Various design solutions for new package testing 2.0 1.5 • Volume support for production operation Characteristics • Proven contact solution for IC device testing • Customized for high-end testing requirements TestSocket • High performance for sensitive device testing • Various design solutions for new package testing • Volume support for production operation Burn-in Socket Test Socket OKins has diverse high performance test sockets to meet customer requirements. The sockets can be u sed for manual test or with ATE handler. Sockets are custom designed for use in engineering, R&D and h OKins offers wide selection of Burn-in Sockets for various device OKins has diverse high performance test sockets to meet customer igh volume production. packages, from Lead packages to Ball packages, including TSOP, requirements. The sockets can be used for manual test or with ATE Design Features Test Solutions QFP, BGA, CSP, LGA, QFN, and CLCC. These Burn-in Sockets support handler. Sockets are custom designed for use in engineering, R&D •Standard/custom design for ATE handler •Design solution for any type of package types •Manual test application with manual lid •Various applications - Production, Development, Engineering, Characterization thermal and electrical stress testing of IC packages. and high volume production. •Standard/custom footprint •Adaptable to most of existing load boards •Dual operation on both ATE and manual •Long operation cycles under ATE handler operation •User friendly designs •Cost effective Product Category •Devices Packages •Packages Digital, Analog, Imaging, Microcontroller,ASIC, EEPROM, Flash, -Lead package: M/TQFP, T/SOP, D/QFN, CLCC, etc Mixed Signal, Wireless, RF, CMOS image sensor, LED -Ball package: BGA, CSP, WLP, etc - Lead package: M/TQFP, T/SOP, D/QFN, CLCC, etc Product Line-up - Ball package: BGA, CSP, WLP, etc BGA/CSP QFN/MLF TQFP TSOP Strip test Pitch (MIN) 0.3mm 0.2mm 0.4mm 0.4mm 0.25mm Contact Spring probes, Spring probes, Spring probes, Spring probes, Spring probes, BGA Genaro pin Genaro pin Genaro pin Stamped pin Genaro pin LGA CSP Product Line-up Product Line-up Clamshell OKins BGA/CSP QFN/MLF TQFP TSOP Strip test Pitch (MIN) 0.3mm 0.2mm 0.4mm 0.4mm 0.25mm BI socket Design Spring probes, Spring probes, Spring probes, Spring probes, Spring probes, QFN TSOP Bottle cap, Contact Genaro pin Genaro pin Genaro pin Stamped pin Genaro pin Open top CLCC QFP All specifications are subject to change without notice 7 3F 37, Malgeunnae 1-gil, Uiwang-si, Gyeonggi-do Korea, 16073 TEL : 82-31-460-3500 / 3535 FAX : 82-31-460-3555 / 3588 E-mail : sales@okins.co.kr